Patent · US Expired

Length measuring device

US4630928A · kind A · utility

10Cited by
3References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 21, 1985
Grant dateDec 23, 1986
Priority date
Expiry dateMar 21, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01D5/24414
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a length measuring device with a measuring transducer system, the curve of two sinusoidal test signals is dependent on the longitudinal movement of the measuring transducer system. An interpolation circuit delivers two high-resolution rectangular pulse sequences F1, F2 corresponding to the interpolated sinusoidal voltages and offset by 90.degree., to an evaluating circuit. To achieve a high-resolution at low speeds of travel and a low-resolution at high speeds, two rectangular pulse sequences S1, S2 or G1, G2, offset by 90.degree. and giving a low-resolution, are additionally derived at the interpolation circuit. A control logic circuit 19 monitors the test voltages for attainment of a certain value of the longitudinal movement per unit time or speed of travel. The control logic circuit lets only the low-resolution rectangular pulse sequences through to the evaluating circuit when this value is exceeded, while it lets the high-resolution rectangular pulse sequences with the low-resolution rectangular pulse sequences when this value is not reached.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.