Patent · US Expired

Method of simultaneously determining gauge and orientation of polymer films

US4631408A · kind A · utility

14Cited by
8References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 24, 1984
Grant dateDec 23, 1986
Priority date
Expiry dateSep 24, 2004

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/869
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In the manufacture of a multilayer polymer film, the thickness and degree of orientation are simultaneously measured. A beam of infrared radiation having predetermined wavelengths is either transmitted through or reflected by the polymer film to be measured and received by a photodetector. The photodetector provides an electrical output signal which can be analyzed to determine the thickness and degree of orientation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.