Beam spot monitoring arrangement for use in a scanning electron beam computed tomography scanner and method
US4631741A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 5, 1984 |
| Grant date | Dec 23, 1986 |
| Priority date | — |
| Expiry date | Apr 5, 2004 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/26
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A scanning beam computed tomography scanner is disclosed herein and includes means defining a vacuum chamber, means for producing an electron beam at one location in the chamber and for directing it to a second location therein, a target of the type which produces X-rays as a result of the impingement thereon by the electron beam, and means for focusing the beam onto the target in the form of a beam spot and for scanning the beam spot across the target along a particular scan path in order to produce X-rays. The specific scanner disclosed also includes an arrangement for monitoring the profile, position and orientation of the beam spot at a plurality of different points along the scan path.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.