Patent · US Expired

Multiple frequency laser interference microscope

US4632554A · kind A · utility

35Cited by
5References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 6, 1983
Grant dateDec 30, 1986
Priority date
Expiry dateDec 6, 2003

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/06
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A multiple frequency laser interference microscope in which a source of coherent laser light containing at least two frequencies of light is used in conjunction with a transmitted light polarizing microscope so as to provide an interference microscope. Using a wide fringe mode of operation refractive index becomes directly visible as shades and hues of different colors, and discontinuities and gradients of less than 0.001 may be detected. Using a narrow fringe mode of operation, measurement of fringe shift and thickness permit exact and rapid calculation of refractive index to 0.00n at least.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.