Patent · US Expired

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US4632559A · kind A · utility

72Cited by
5References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 21, 1985
Grant dateDec 30, 1986
Priority date
Expiry dateFeb 21, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/064
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Reflectance apparatus is disclosed for obtaining measurement of nonspecular reflected light in which controlled light rays are directed by means of a lens and transmission path from a light source through a light trap to expose or illuminate a specimen and nonspecular reflected light is passed from the specimen through the light trap along a transmission path to one or more detectors where the nonspecular reflected light is measured.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.