In-situ gas analyzer
US4632563A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 12, 1984 |
| Grant date | Dec 30, 1986 |
| Priority date | — |
| Expiry date | Jun 12, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0231
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A gas analyzer which utilizes an infrared beam which passes through or has emanated from a gas stream. The analyzer has a plurality of gas cells which contain gas of the type whose concentration is being measured in various concentrations and at various total pressures. A beam of energy is forwarded to the analyzer, and is passed selectively to the various cells. In one embodiment, the cells are mounted where a rotatable deflector can selectively deflect and receive the beam to and from two fixed beam segments so that sequential readings at an infrared detector can provide measurements of concentrations, and calibration. In another embodiment, the cells are selectively moved into the beam path. The beam is formed and forwarded by a Cassegrainean system or by a combination of reflectors including a retro-reflector. An infrared calibration beam which does not pass through the gas stream is utilized for calibration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.