Patent · US Expired

Feedback circuit for a semiconductor active element sensor

US4633099A · kind A · utility

15Cited by
14References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 22, 1983
Grant dateDec 30, 1986
Priority date
Expiry dateNov 22, 2003

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L9/06
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The drain voltage of an IGFET having a channel responsive to the change in physical quantity to be measured is negatively fed back to the gate terminal of the IGFET. The negative feedback loop includes series connection of a first amplifier having an amplification factor larger than unity and a second amplifier having an amplification factor smaller than unity. The interconnection point between the first and the second amplifiers is connected to the output terminal. There is provided a stable, highly sensitive and highly reliable semiconductor sensor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.