Testing method and apparatus for electronic components
US4633175A · kind A · utility
17Cited by
4References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 23, 1984 |
| Grant date | Dec 30, 1986 |
| Priority date | — |
| Expiry date | Nov 23, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/016
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for testing and/or burning-in electronic devices such as capacitors is disclosed. The devices are loaded in a matrix having a multiplicity of apertures. A second matrix having complemental apertures is provided, the apertures of the second matrix being filled with fuses. The matrices are pressed together by yieldable electrodes which are connected with a source of current.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.