Patent · US Expired

Method of automated in-place SCR testing

US4633241A · kind A · utility

12Cited by
4References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 20, 1984
Grant dateDec 30, 1986
Priority date
Expiry dateNov 20, 2004

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH02H3/04
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An automated SCR cell test exercises each of the twelve SCRs in a dual, 3 phase, full wave SCR rectifier bridge singly to detect shorted SCRs and in pairs to detect open SCRs or faulty gate circuits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.