Method of three-dimensional measurement with few projected patterns
US4634278A · kind A · utility
46Cited by
1References
3Claims
0Family size
Assignee
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Key dates
| Filing date | Feb 6, 1984 |
| Grant date | Jan 6, 1987 |
| Priority date | — |
| Expiry date | Feb 6, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2536
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods are provided for reducing the number of projected patterns required to make two- or three-dimensional surface measurements on a sub-class of surfaces comprising relatively smooth surfaces. By including apriori knowledge about the surface to be measured, pattern ambiguities can be resolved by processing rather than by additional projected patterns.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.