Method and apparatus for monitoring response signals during automated testing of electronic circuits
US4635259A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 1984 |
| Grant date | Jan 6, 1987 |
| Priority date | — |
| Expiry date | May 17, 2004 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2005/0026
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A plurality of test signal applying and response signal monitoring circuits is coupled to pins of an electronic device being tested to force test stimuli signals onto input pins of the device under test. The response signals are monitored while the device is being tested. Each test signal applying and response signal monitoring circuit includes a node to be coupled to a pin of the device under test, a digitally programmed source for supplying a test signal connectable to the node by a first switch, and a comparison circuit connected to the node by a second switch for indicating the relative magnitude of the response signal with respect to a programmed reference level on a repetitive basis during testing to increase test rate. Other features are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.