Patent · US Expired

Methods and apparatus for measuring the tightness of enclosures

US4635469A · kind A · utility

11Cited by
7References
20Claims
0Family size

Inventors

Key dates

Filing dateJun 21, 1985
Grant dateJan 13, 1987
Priority date
Expiry dateJun 21, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M3/3236
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed are methods and apparatus for measuring tightness of an enclosure such as a building by utilizing alternating pressurization techniques. One method comprises providing apparatus capable of causing an internal volume change for the enclosure, the apparatus including a means for determining the instantaneous volume change, and a means for determining the instantaneous pressure within the enclosure. The apparatus is operated within the enclosure to change the volume thereof, and at least one of the frequency and the displacement is adjusted to achieve a root mean square pressure in the enclosure approximately equal to a reference pressure. At that pressure, the leakage of the enclosure is determined from the instantaneous displacement and instantaneous pressure values.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.