Method of and apparatus for imaging surface of object at high temperature
US4641036A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 21, 1984 |
| Grant date | Feb 3, 1987 |
| Priority date | — |
| Expiry date | Sep 21, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0696
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of imaging the surface of an object at high temperature includes the steps of: irradiating the surface of a high-temperature object with two different kinds of pulses of monochromatic light of a fundamental wave and a harmonic thereof; passing the reflected light from the surface of the object through both an interference filter which allows only the two different kinds of monochromatic light to pass and a high-speed optical switch thereby to remove any background light component; drawing out only the reflected light of the pulses and leading the same to an image generating mechanism where it is converted into an image; and controlling the voltage applied to the high-speed optical switch thereby to adjust the mixing ratio between two wavelengths. Also disclosed is an apparatus for imaging the surface of an object at high temperature which includes: a light pulse generator provided such as to be opposed to high-temperature object; and an interference filter, a half-mirror, a high-speed optical switch and an image generating mechanism which are successively disposed on the optical axis of the reflected light from the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.