Sampling waveform digitizer for dynamic testing of high speed data conversion components
US4641246A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 20, 1983 |
| Grant date | Feb 3, 1987 |
| Priority date | — |
| Expiry date | Oct 20, 2003 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/66
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A sampling digitizer system which may be expanded for the dynamic testing of high speed data conversion components is provided. The system includes latching comparators which are supplied with the waveform under test and the comparator digital output is integrated by an operational amplifier integrator and fed back to the reference input of the latching comparator to form a comparator-integrator loop. A circuit provides strobe pulses which repeatedly sample the latch enable input of the comparators at a selected time/point until the integrator feedback forces the comparator reference input to be equal to the sample value of the input signal. At this point, an equilibrium state is reached where the integrator output oscillates about the sampled value, and when the loop settles, an analog-to-digital converter reads the final value under computer command. The sample point is computer controlled through a programmable delay line. A modified T-filter system operatively coupled between the output of the latching comparator and the input of the operational amplifier allows control of the integrator slope and filters out signal spikes to allow the required accuracy for high speed measureme…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.