Test fixture having full surface contact hinged lid
US4644269A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 31, 1983 |
| Grant date | Feb 17, 1987 |
| Priority date | — |
| Expiry date | May 31, 2003 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R13/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The test fixture for automatic testing equipment of the present invention includes a cover pivotally mounted to an electronic test bed, and means mounted to the cover and operative as the cover is closed to provide full surface contact with an electrical circuit device to be tested. In preferred embodiment, the test fixture includes a spring-loaded lid that is snap-latchable to, and push-button releasable from, a test bed. A lid panel-inset is rotatably mounted to the lid at a preselected acute angle thereto. The angle is selected such that the panel-inset provides full surface contact with an electrical circuit to be tested when the lid engages the electrical device. The panel-inset rotates to maintain full surface contact while the lid is latched to the test bed. The lid panel-inset provides an abutment surface that is always equally distant from the electrical circuit device to be tested which distributes the impact of the lid panel-inset uniformly over the entire surface area of the electrical circuit device to be tested, thereby substantially eliminating device misalignment occasioned by non-uniform forces and torques.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.