Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
US4646299A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 1984 |
| Grant date | Feb 24, 1987 |
| Priority date | — |
| Expiry date | May 17, 2004 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2005/0026
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A plurality of test signal applying and monitoring circuits are coupled to pins of an electronic device being tested to force test stimuli signals onto input pins of the device under test. The response signals are monitored while the device is being tested. Each test signal applying and monitoring circuit includes a node to be coupled to a pin of the device under test, a digitally programmed source for supplying a test signal connectable to the node by a first switch, and a comparison circuit connected to the node by a second switch for indicating the relative amplitude of the response signal with respect to a programmed reference level. The digitally programmed source is included for providing gated voltage-current crossover forcing functions during functional testing to minimize the disturbance when the device being tested is connected and to protect out of tolerance devices. Programmable voltage and current values define a pass window to assure a non-ambiguous go/no-go result during testing. Other features are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.