High brilliance lensless projection system of test patterns
US4651012A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 21, 1985 |
| Grant date | Mar 17, 1987 |
| Priority date | — |
| Expiry date | Mar 21, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2201/068
- WIPO fieldEngines, pumps, turbines
- WIPO sectorMechanical engineering
Abstract
A projection system derived from certain solid geometrical properties using two aperture plates bearing arrays of holes with well defined spacing projects radiation from diverse sources such as electromagnetic radiation, visible and invisible light radiation, discrete particles, X-rays, gamma rays, charged and uncharged particles, as a multi-dot radiation image pattern onto a distant target, overcoming the enormous intensity losses inherent in prior art for pin hole projection of test patterns. The source angular emission function may be of nearly any type, from omni-directional (perfectly diffuse) to uni-directional. Such dot patterns are suitable for evaluating imaging systems as well as the critical operating parameters of mapping spectrometer sensors. The lensless projection system is capable of superimposing radiation source rays from every hole in the first aperture plate onto each image dot at the focal plane with dramatic increase in intensity of the projected image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.