Patent · US Expired

CCD gate definition process

US4652339A · kind A · utility

10Cited by
6References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 24, 1986
Grant dateMar 24, 1987
Priority date
Expiry dateFeb 24, 2006

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/978

Abstract

A CCD gate definition process utilizing a thin film layer in a double masking process to form a first and second oxide layer over the polysilicon gate material to provide a profiled and tapered oxide layer over the gate without any re-entrant oxide steps.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.