One-sided ion migration velocity measurement and electromigration failure warning device
US4652812A · kind A · utility
15Cited by
8References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 27, 1984 |
| Grant date | Mar 24, 1987 |
| Priority date | — |
| Expiry date | Nov 27, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Cathode migration is reduced by increasing the width of the cathode at its leading edge compared to the width of the anode at its leading edge. Electromigration to a specific degree may be measured by placing an additional conductor connected to the anode portion of the base conductor and separated from the anode by the base conductor. A rapid change in resistance can be sensed as the anode electrically migrates past the additional conductor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.