Patent · US Expired

Self-aligned recessed gate process

US4656076A · kind A · utility

150Cited by
8References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 26, 1985
Grant dateApr 7, 1987
Priority date
Expiry dateApr 26, 2005

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/258

Abstract

An integrated circuit gate process and structure are disclosed which provide a self-aligned, recessed gate enhancement-mode GaAsFET. The process includes making self-aligned implants prior to gate metallization, with an intermediate step of applying patches of plasma- and chemical-etch resistant dielectric, such as zirconium oxide (ZrO), over the self-aligned implants to fixedly define gate length. The self-aligned gate process includes stair-stepping three successive implants, in respect to both depth and concentration, to provide a dopant concentration gradient inclined depthwise away from each side of the gate. The self-aligned, recessed gate GaAsFET exhibits improved source-gate resistance without degradation of gate-drain capacitance, increased gain and drain-source current, and reduced knee-voltage. Gate length is minimized to the limits of photolithography without degrading input resistance.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.