Self-aligned recessed gate process
US4656076A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 26, 1985 |
| Grant date | Apr 7, 1987 |
| Priority date | — |
| Expiry date | Apr 26, 2005 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/258
Abstract
An integrated circuit gate process and structure are disclosed which provide a self-aligned, recessed gate enhancement-mode GaAsFET. The process includes making self-aligned implants prior to gate metallization, with an intermediate step of applying patches of plasma- and chemical-etch resistant dielectric, such as zirconium oxide (ZrO), over the self-aligned implants to fixedly define gate length. The self-aligned gate process includes stair-stepping three successive implants, in respect to both depth and concentration, to provide a dopant concentration gradient inclined depthwise away from each side of the gate. The self-aligned, recessed gate GaAsFET exhibits improved source-gate resistance without degradation of gate-drain capacitance, increased gain and drain-source current, and reduced knee-voltage. Gate length is minimized to the limits of photolithography without degrading input resistance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.