Patent · US Expired

Simultaneous multiple wavelength photometer

US4657398A · kind A · utility

6Cited by
6References
3Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 10, 1985
Grant dateApr 14, 1987
Priority date
Expiry dateJun 10, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/59
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Simultaneous multiple photometer measurements are made by simultaneously passing light to be measured through multiple light paths to different locations of a circularly variable filter; passing the light through the circularly variable filter at said locations; collecting the light passed through the circularly variable filter at each location; transmitting the light passed through the circularly variable filter to separate detectors; and measuring the light transmitted along each light path by said detectors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.