WSI tester
US4658400A · kind A · utility
20Cited by
8References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 7, 1984 |
| Grant date | Apr 14, 1987 |
| Priority date | — |
| Expiry date | Jun 7, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/006
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A test system including a data center, controller, interface, and device under test. The data center generates a test program which is applied to the device under test by the controller via the interface. The device under test includes circuitry structured for testing. The test system identifies the location of faulty elements on the device under test and stores these locations for use in a subsequent repair step.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.