Head for measuring reflectance

US4666309A · kind A · utility

Assignee

• Compur-Electronic GmbH · DE

Inventors

• Jurgen Barry · Munich, DE
• Karl P. Jansky · Münsing, DE

Key dates

• Filing date: Jul 1, 1983
• Grant date: May 19, 1987
• Expiry date: Jul 1, 2003

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2021/4742
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present invention is with respect to a reflectance measuring head that is designed for stopping the production of false readings by regular (as opposed to diffuse) reflection and shiny parts of the sample without using normal shine traps or diaphragms. False readings as produced by regular reflection, by surface grain or structure and by inhomogeneity of the surface of the sample are furthermore put an end to by having a number of transmitters placed at an equal distance from one receiver or having a number of receivers placed at an equal distance from a transmitter. A more specially useful effect is produced if a number of transmitters and a number of receivers are placed alternately in the form of a matrix.