Method of testing and addressing a magnetic core memory
US4669082A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 9, 1985 |
| Grant date | May 26, 1987 |
| Priority date | — |
| Expiry date | May 9, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2205
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of testing a magnetic core memory includes writing a test bit to each storage location addressed by each X-drive/X-sink transistor pair and each Y-drive/Y-sink transistor pair to determine which transistor or transistors of each pair is or are inoperable. Once this determination is made, a memory status map is created designating the inoperable transistors. Thereafter, the map contents are converted into an address field for matching against a selected memory address. If the selected memory address calls for an inoperable transistor, as indicated by a comparison with the address field, this is detected and the address changed until only operable transistors are accessed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.