Patent · US Expired

Stabilization of intraconnections and interfaces

US4675466A · kind A · utility

5Cited by
2References
23Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 5, 1986
Grant dateJun 23, 1987
Priority date
Expiry dateApr 5, 2006

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P70/50

Abstract

Stabilization of energy sensitive semiconductive devices by forming initial electrodes which are exposed through an overlying layer of semiconductor, dipping the exposed electrodes in solutions containing specified chemicals, such as metallic ion solutions of nickel, cobalt, chromium and related metals, followed by rinsing, drying and the final deposition of an overlying electrode by metallization.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.