Patent · US Expired

Optical instrument for measuring displacement

US4676645A · kind A · utility

57Cited by
2References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 5, 1984
Grant dateJun 30, 1987
Priority date
Expiry dateNov 5, 2004

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01D5/38
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Optical instrument for measuring displacement comprising a movable diffraction grating used as a scale, a semiconductor laser device, photodetectors, and means for making two light beams diffracted by the diffraction grating interfere with each other in which displacement of said diffraction grating is measured, based on variations of interference signals. The laser device has a suitable coherency for making selectively two necessary light beams with equal optical path lengths interfere with each other.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.