System and process for measuring and correcting the values of a parameter of a sheet material
US4678915A · kind A · utility
23Cited by
4References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 14, 1985 |
| Grant date | Jul 7, 1987 |
| Priority date | — |
| Expiry date | Mar 14, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2210/46
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for measuring the values of a parameter of a sheet of material is provided. The system includes a head system with sensors mounted therein and a distance correction system to correct the measured parameter for variations in the distance between parts of the head system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.