High speed testing of electronic circuits by electro-optic sampling
US4681449A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 7, 1984 |
| Grant date | Jul 21, 1987 |
| Priority date | — |
| Expiry date | Sep 7, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2656
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Non-contact measurement of signals up to and beyond 100 GHz is provided by electro-optical sampling the field in a transmission line. A first laser signal is employed to optically generate signals in a III-V compound semiconductor such as gallium arsenide. The signal is transmitted to microstrip on the semiconductor surface, and a second polarized laser signal is passed through the crystal and its polarization is modulated by the electric field in the microstrip. The polarization presents a measure of the field strength and hence the signal. By varying the relative delay between two beams, an equivalent time representation of the sampled signal is obtained.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.