Method and apparatus for rapidly testing capacitors and dielectric materials
US4683417A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 10, 1985 |
| Grant date | Jul 28, 1987 |
| Priority date | — |
| Expiry date | May 10, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/2605
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The apparatus comprises a measuring unit (300) which receives a component to be tested (Cx) in series with a reference impedance in a measuring chain, a clock (100) suitable for applying repetitive stimulating pulses to the measuring chain, means for resetting the voltage at the terminals of the reference impedance to zero during each inactive half-cycle of the stimulating pulses, sampling means (400) which sample the response at instants which are progressively shifted relative to the stimulating pulses, and a processing unit (200) which analyzes the samples taken by the sampling unit to deduce the parameters of the tested item using a Foster model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.