Patent · US Expired

Leadless chip test socket

US4683423A · kind A · utility

19Cited by
13References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 30, 1985
Grant dateJul 28, 1987
Priority date
Expiry dateOct 30, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/0483
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test socket for a leadless chip carrier is disclosed in which a clamp is pivotally mounted to a base member, such that the carrier can be inserted into a recess in the base member and the clamp pivoted closed to lock the carrier in place. The clamp includes a set of arms which engage corresponding brackets on the base to progressively secure the carrier and chip as the clamp is rotated either clockwise or counterclockwise. The clamp makes direct contact with the chip to assure a good electrical connection with underlying electrical contact springs.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.