Method for the localization of time-critical events within a clock electronic circuit

US4686455A · kind A · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Reiner Lassmann · Munich, DE
• Albert Krupp · Munich, DE
• Peter Fazekas · Munich, DE

Key dates

• Filing date: Aug 2, 1984
• Grant date: Aug 11, 1987
• Expiry date: Aug 2, 2004

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/305
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Time-critical events are localized within a clocked electronic circuit without requiring cyclical operation By way of measuring at the outputs of the circuit, the limit frequency of the circuit is identified. A test pattern sequence is then applied to this circuit. The number n of that test pattern at which errors are perceived at the outputs is identified, in particular with a clock frequency higher than the identified limit frequency of the circuit. The test patterns having the numbers n-m are applied to the circuit with a clock frequency greater than the identified limit frequency of the circuit and the remaining n test patterns are applied to the circuit with a clock frequency lower than the identified limit frequency of the circuit, being applied thereto in succession step-by-step with m=1,2,3 . . . in at least one run of n test patterns. A check is carried out after every run of a test pattern sequence of n test patterns as to whether an error still exist at the output until an error can no longer be documented at the output and a determination is thus made with respect to which test pattern having the number n-m the error is generated within the -circuit. An error tracking t…