Buckling beam test probe assembly

US4686464A · kind A · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Michael Elsasser · Herrenberg, DE
• Roland Stohr · Nufringen, DE

Key dates

• Filing date: Jun 3, 1985
• Grant date: Aug 11, 1987
• Expiry date: Jun 3, 2005

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/07357
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The buckling beam probe contactor assembly comprises a number of square test probe arrays each containing a plurality of buckling beams in the form of continuous wires extending from the probe tips to a remote test apparatus. The buckling beams pass through an adjustable beam carrier block and through a number of guide plates which are kept in predetermined distances along the buckling beams by means of thin stabilizing rods arranged at the corners of the test probe array. The guide plates are inserted into grid-like frames which allow the arrangement of a plurality of test probe arrays close to each other wherein each array may contain test probes over its full area except for the locations occupied by the thin stabilizing rods.