Probe for an apparatus for analyzing metals by X-ray fluorescence
US4686694A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 15, 1980 |
| Grant date | Aug 11, 1987 |
| Priority date | — |
| Expiry date | Dec 15, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for analyzing metal alloys includes an electronic unit connected to a hand-held probe unit. The probe unit includes a radiation detector enclosed in a detector housing and a radiation source enclosed in a source housing. The detector housing is generally cylindrical in shape and has an aperture formed in its sidewall. The source housing is formed as a hollow, generally right triangular prism with an open base attached to the detector housing over the aperture and tapering to a tip having an aperture formed therein. The triangular shape of the source housing permits contact measurements in hard to get at places. A shutter drive mechanism is utilized to move a shutter means between a first position blocking radiation and a second position passing radiation from the source to the aperture in the tip of the source housing. Radiation from the source generates X-rays from a sample of material to be analyzed which X-rays pass through the aperture in the tip of the source housing and the aperture in the side wall of the detector housing to the radiation detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.