Patent · US Expired

Gas analysis apparatus and method

US4690562A · kind A · utility

7Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 19, 1985
Grant dateSep 1, 1987
Priority date
Expiry dateJun 19, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/1245
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus and method for analysing a gas of the kind adapted to produce an interference pattern displacements of which are indicative of changes of the constitution of the gas involves exposing an array 8 of photosensitive elements to the interference pattern. Respective digital indications of the intensity of the interference pattern falling of the elements are produced by means of a timing circuit 16 adapted to clock data out of the array 8 as a series of analogue pulses which are held by a fast peak detector 17 and converted by an analogue-to-digital converter 18 into digital indications. The position of a principal peak of the interference pattern is then determined by means of a microprocessor (not shown) adapted to determine the best fit of the digital indications with appropriate pre-stored values.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.