Patent · US Expired

Integrated circuit tester socket

US4691975A · kind A · utility

29Cited by
4References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 21, 1986
Grant dateSep 8, 1987
Priority date
Expiry dateOct 21, 2006

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K7/1007
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

In order to construct an IC-tester socket as a whole into a compact size and to make the mounting and removal of an IC package easy and further to enable stable and positive contact between the lead terminals of the IC package and contact pins, the IC-tester socket is comprised of a socket body capable of accomodating an IC package; a plurality of contact pins provided within the socket body and each having resilient first and second arms capable, in their normal state, of nipping each said lead terminal; and releasers mounted vertically movably on the socket body for being able to release the nipping of the lead terminals done by these first and second arms.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.