Automatic refractometer
US4692024A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | May 10, 1985 |
| Grant date | Sep 8, 1987 |
| Priority date | — |
| Expiry date | May 10, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4719
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical refractometer for automatically determining the principal indices of a specimen receives an incident radiation beam which is reflected by a first rotatable mirror onto a reflecting surface of a first elliptical mirror wherein the axis of rotation of the first rotatable surface extends through a first focus of the first elliptical mirror. A hemicylinder has a center of curvature at a second focus of the first elliptical mirror and rotatably and translatably mounts a specimen about a first axis and along second and third axes, respectively, such that a portion of the specimen is located at the second focus to receive the reflected incident beam from the first rotatable surface. A second elliptical mirror has third and fourth foci and a second surface for reflecting the incident radiation beam from the second elliptical mirror with an axis of rotation extending through the fourth focus with the third focus being at the first axis coincident with the second focus for producing a reflected beam output. The rotation of the first and second rotatable surface is controllable to alter the angle of the incident radiation and the angle of the reflected beam output, and for rotating…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.