Apparatus for generating patterns of test signals

US4692920A · kind A · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Rolf Tannhaeuser · Krailling, DE
• Franz Herrmann

Key dates

• Filing date: Apr 30, 1986
• Grant date: Sep 8, 1987
• Expiry date: Apr 30, 2006

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31921
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A tester generates test signals for tested units at high speed. At its connecting elements to which the unit under test is connected, the tester emits patterns of test signals, or receives output signals from the unit under test, and compares the same to the test signals. For the purpose of generating the test signals, a respective test generator is assigned to each connecting element, the test signals assigned to the connecting element being stored in coded form in the test signal generators. The coded test signals are addressed by an address control, the test signals to be emitted in the coded form over the connecting element or to be compared to output signals emitted by the unit under test. The test signal generator comprises a memory in which the coded test signals are stored and a decoder which assigns the test signal stored in the memory to the connecting element either in decoded form or unaltered.