Method and apparatus for measuring the light scattering properties of small particles
US4693602A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 6, 1984 |
| Grant date | Sep 15, 1987 |
| Priority date | — |
| Expiry date | Nov 6, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4711
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The measurement of the scattering properties of very small particles by electro-optical means generally requires the use of an intense, though highly spatially inhomogeneous, light source such as a laser. Many instruments require, therefore, that the intersection of the particle stream with the illumination source be precisely regulated so that the flux incident on the particle be known accurately. A method and apparatus are described by which means the absolute intensity of the light incident on the particle need not be known. A special structure and measurement process are described by which means small particles are differentiated from larger particles grazing the illumination beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.