Integrated circuit tester and remote pin electronics therefor
US4694242A · kind A · utility
14Cited by
3References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 20, 1986 |
| Grant date | Sep 15, 1987 |
| Priority date | — |
| Expiry date | Jun 20, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31926
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates, in general, to an electronic and measuirng circuits are located remotely from the test head. A low device count circuit at each pin performs the necessary high speed switching. The force and measure lines are relatively long, but the signal rates are low enough to be accurately transmitted. The only high rate signals are on lines coupled to the gates of FET switches at the test head. Thus, multiple pin, high speed testing can be accomplished using relatively small and inexpensive test heads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.