Analysis with electron microscope of multielement samples using pure element standards
US4697080A · kind A · utility
17Cited by
9References
3Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 6, 1986 |
| Grant date | Sep 29, 1987 |
| Priority date | — |
| Expiry date | Jan 6, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/2251
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons, simultaneously measuring the electron dosage and x-ray intensities for each sample of element to determine a "K.sub.AB " value to be used in the equation ##EQU1## where I is intensity and C is concentration for elements A and B, and exposing the multielement sample to determine the concentrations of the elements in the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.