Patent · US Expired

Measuring system and measuring cell for making magnetic field measurements

US4697145A · kind A · utility

4Cited by
0References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 24, 1985
Grant dateSep 29, 1987
Priority date
Expiry dateJan 24, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/0322
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A process and apparatus for measuring a magnetic field based on the Faraday effect rotation of a light beam passing through a ferrimagnetic coating subject to a magnetic field to be measured is shown. The magnetization direction within the ferrimagnetic coating is coherently oriented by applying a high amplitude alternating magnetic field oriented in accordance with the axis of the light beam. This is followed by a progressive reduction of the amplitude of this magnetic field and the magnetic field to be measured is compensated. A system and a measuring cell making it possible to perform said process is also shown.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.