Arrangement for measuring potential differences

US4701697A · kind A · utility

Assignee

• Max-Planck-Gesellschaft · DE

Inventors

• Dietrich W. Lubbers · Dortmund, DE
• Norbert Opitz

Key dates

• Filing date: Jan 20, 1984
• Grant date: Oct 20, 1987
• Expiry date: Jan 20, 2004

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R19/10
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

To measure potential differences in second-class conductors without interference potentials, there are provided a potential generator cooperating with a potential-measuring structure. This structure includes a substrate of electrically highly insulating and chemically inert material embedding optical indicators whose optical properties change as a function of the applied electric potential difference. Both the potential generator and the potential-measuring structure have boundary surfaces which are in contact with the second-class conductor and opposite surfaces interconnected by an equalizing conductor. A light-measuring device is arranged for intercepting light changes in the indicators, thus measuring the potential difference.