Apparatus and method for testing the calibration of a hard disk substrate tester
US4702101A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 12, 1985 |
| Grant date | Oct 27, 1987 |
| Priority date | — |
| Expiry date | Aug 12, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B33/10
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An apparatus for testing the calibration of hard disk substrate tester includes a calibrating micrometer moving a known surface to at least two distances from a non-contact detector in the hard disk surface tester and a known distance from each other, and further includes a piezoelectric transducer mounted to the known surface moved by the calibrating micrometer, and an oscillator oscillating the surface at predetermined frequencies and amplitudes. A method for determining the status of calibration of the hard disk substrate tester places a known surface at least two distances from or positions in relation to a surface detector in the hard disk substrate tester, determining the distance between these positions, driving the known surface usually by generating an oscillation thereof by a piezoelectric transducer at one or at a set or plurality of predetermined monotone frequencies and amplitudes, and determining the calibration of the hard disk substrate tester by comparing its output with the corresponding predetermined frequency and amplitude of the driven surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.