Method and apparatus for obtaining properties of subsurface formations from textural models derived from formation parameters
US4703277A · kind A · utility
16Cited by
8References
92Claims
0Family size
Assignee
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Key dates
| Filing date | Apr 13, 1984 |
| Grant date | Oct 27, 1987 |
| Priority date | — |
| Expiry date | Apr 13, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/38
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Well logging techniques are disclosed which use and/or measure formation textural parameters. A disclosed formation textural model is bimodal in nature, and includes fractions of spherical grains and of platey grains having a single aspect ratio. This model is used in obtaining improved well logging recordings.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.