Patent · US Expired

Test probe for leadless devices

US4705333A · kind A · utility

1Cited by

5References

10Claims

0Family size

Assignee

Pylon, Inc · VG

Inventors

Stephen T. Sicard · Norton, US
Brian A. Pedro · Attleboro, US
Wayne Stewart Alden, III · Whitman, US

Key dates

Filing date	Aug 21, 1985
Grant date	Nov 10, 1987
Priority date	—
Expiry date	Aug 21, 2005

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10S439/912
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An electrical test probe assembly for use with a leadless surface mounted device is provided which includes an array of resilient spring contacts in a pattern corresponding to the contacts of a leadless device. The array of spring contacts are configured to grip the peripheral edges of a surface mounted device, with each spring contact in biased engagement with a respective contact of the device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.