Method and apparatus for determining real gas effects in critical flow nozzles
US4706492A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 16, 1986 |
| Grant date | Nov 17, 1987 |
| Priority date | — |
| Expiry date | Jun 16, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01F25/15
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for determining the gas flow rate in a high pressure critical flow nozzle is disclosed. A high pressure gas flows through a first critical flow nozzle. Upstream of the first critical flow nozzle a small slip-stream of gas is removed and flows through a smaller second critical flow nozzle. The small second critical flow nozzle drops the pressure of the gas to a low level. This flow rate of this low pressure gas stream is measured in a highly accurate low pressure gas flow rate measuring device. Since the flow rate in this device must be the same as that of the second critical flow nozzle, a correction factor can be calculated for the second critical flow nozzle. This flow rate correction factor will be the same for the first critical flow nozzle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.