Patent · US Expired

Apparatus for plasma diagnostics

US4707133A · kind A · utility

15Cited by
3References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 6, 1986
Grant dateNov 17, 1987
Priority date
Expiry dateMar 6, 2006

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/314
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for measuring the density of certain ions or neutrals within a plasma without probe intervention. When cylindrical symmetry is present, the system also provides measurement of spatial distribution of excited ionic states within the plasma. The system allows spatial distribution of contaminant ions in magnetic confinement thermonuclear fusion devices to be monitored. These functions are accomplished by directing two laser beams through a region containing a plasma. The laser means are at respective wavelengths chosen to be in and closely adjacent to a spectral region near the electronic transition frequency of the ionic species of interest in the plasma. The intensities of the two wavelengths are then measured and compared to obtain the desired data and characterization.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.