Patent · US Expired

Device and method for testing the wave front quality of optical components

US4707137A · kind A · utility

25Cited by
8References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 25, 1985
Grant dateNov 17, 1987
Priority date
Expiry dateOct 25, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2290/30
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A device and method for testing the wave front quality of an optical component. The device is a shearing interferometer having two gratings to split and recombine a wave front beam to form interference fringes. The pattern of the fringes provides a means for measuring collimation error, astigmatism, and coma present in the beam.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.