Device for measuring plasma properties
US4707147A · kind A · utility
16Cited by
7References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 30, 1985 |
| Grant date | Nov 17, 1987 |
| Priority date | — |
| Expiry date | Dec 30, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/314
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for measuring properties of plasma projects linearly polarized light to an object plasma as incident light, and the light coming from the plasma in response to the incident light is separated into an S-polarized component and a P-polarized component, so that temperature and other properties of the plasma are determined from such S- and P-polarized components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.