Patent · US Expired

Process for characterizing suspensions of small particles

US4710025A · kind A · utility

38Cited by
5References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 9, 1985
Grant dateDec 1, 1987
Priority date
Expiry dateSep 9, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2015/1477
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus and process are described for the characterization and/or identification of suspensions of microparticles based upon the measurement of certain optical observables produced as the suspension is illuminated by a beam of light, or other electromagnetic radiation. Selected observables calculated from the scattered radiation detected by a plurality of detectors surrounding the thus-illuminated suspension are then used to recall specific maps, from a computer memory means, one for each observable. The common overlap region of said map yields characterizing or identifying particle suspension physical parameters.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.